Nishijima G., Mukoyama S., Matsumoto S., Nakai A., Sakamoto H., Hamada M., Miyoshi Y., Nakasaki R., Saito K.
Ключевые слова: presentation, HTS, coated conductors, MOCVD process, REBCO, long conductors, critical caracteristics, critical current, homogeneity, width, magnetic field dependence, temperature dependence, mechanical properties, tensile tests, stress effects, pinning, thickness dependence, CORC cables, current-voltage characteristics, status
Ключевые слова: mechanical properties, measurement setup, bending radius, tensile tests, strain effects, stress effects, stabilizing layers, thickness dependence, transverse stress, presentation, HTS, REBCO, coated conductors, IBAD process, MOCVD process, substrate Hastelloy, critical caracteristics, critical current, homogeneity, long conductors, Jc/B curves, width, electromechanical analysis
Zhang Y., Hazelton D.W., Schmidt R.M., Nakasaki R., Knoll A.R., Abraimov D., Sundaram A., Brownsey P., Kasahara M., Fukushima T., Carota G.M., Cameron J.B., Schwab G., Hope L.V., Kuraseko H.
Zhu S., Welp U., Zhang Y., Selvamanickam V., Fang L., Jia Y., Nakasaki R., Crabtree G.W., Kwon J., Glatz A., Chaparro C., Koshelev A.E., Leroux M., Sadovskyy I.A., Hu H., Zuo J.-M., Kwok W.-K
Ключевые слова: HTS, coated conductors, substrate Ni-W, buffer layers, electron beam evaporation, YBCO, PLD process, MOD process, magnetization, texture, fabrication, magnetic properties
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